Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Nano Letters Année : 2012

Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum

Résumé

This article presents a study of the poorly understood "Shear-Force" used in an important class of near-field instruments based on mechanical resonance feedback detection. In the case of a metallic probe near a metallic surface in vacuum, we observed that fluctuations of the oscillator resonance frequency likely induced by local charge variation could account for some unexplained reported effects in the literature.
Fichier principal
Vignette du fichier
version nanolett 3.pdf (663.36 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01565118 , version 1 (03-10-2017)

Identifiants

Citer

Alessandro Siria, Thomas Barois, Kenny Vilella, Sorin Perisanu, Anthony Ayari, et al.. Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum. Nano Letters, 2012, 12 (7), pp.3551-3556. ⟨10.1021/nl301618p⟩. ⟨hal-01565118⟩
38 Consultations
100 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More