Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum
Abstract
This article presents a study of the poorly understood "Shear-Force" used in an important class of near-field instruments based on mechanical resonance feedback detection. In the case of a metallic probe near a metallic surface in vacuum, we observed that fluctuations of the oscillator resonance frequency likely induced by local charge variation could account for some unexplained reported effects in the literature.
Domains
Mechanics [physics]
Origin : Files produced by the author(s)
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