Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum - Archive ouverte HAL Access content directly
Journal Articles Nano Letters Year : 2012

Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum

Abstract

This article presents a study of the poorly understood "Shear-Force" used in an important class of near-field instruments based on mechanical resonance feedback detection. In the case of a metallic probe near a metallic surface in vacuum, we observed that fluctuations of the oscillator resonance frequency likely induced by local charge variation could account for some unexplained reported effects in the literature.
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Dates and versions

hal-01565118 , version 1 (03-10-2017)

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Alessandro Siria, Thomas Barois, Kenny Vilella, Sorin Perisanu, Anthony Ayari, et al.. Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum. Nano Letters, 2012, 12 (7), pp.3551-3556. ⟨10.1021/nl301618p⟩. ⟨hal-01565118⟩
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