Electron Fluctuation Induced Resonance Broadening in Nano Electromechanical Systems: The Origin of Shear Force in Vacuum
Résumé
This article presents a study of the poorly understood "Shear-Force" used in an important class of near-field instruments based on mechanical resonance feedback detection. In the case of a metallic probe near a metallic surface in vacuum, we observed that fluctuations of the oscillator resonance frequency likely induced by local charge variation could account for some unexplained reported effects in the literature.
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