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Etching Process Scalability and Challenges for ULK Materials

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Abstract

With the scaling down of integrated circuit devices, a constant effort is needed to improve the patterning technologies of interconnect stacks using either the metallic masking strategy or the organic masking strategy. Critical dimensions and profile control, plasma-induced damages (modifications, post etch residues, porous SiOCH roughening) are the key challenges to successfully pattern dual damascene porous SiOCH structures. We have compared the patterning performances of both masking strategies in terms of profile control. One of the main challenges is to optimize the plasma processes to minimize the dielectric sidewall modification. This has been achieved by using optimized or new characterization techniques such as scatterometric porosimetry, infrared spectroscopy, x-ray photoelectron spectroscopy.
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Dates and versions

hal-00625314 , version 1 (17-10-2022)

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Attribution - NonCommercial - CC BY 4.0

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T. Chevolleau, N. Posseme, T. David, R. Bouyssou, J. Ducote, et al.. Etching Process Scalability and Challenges for ULK Materials. International Interconnect Technology Conference, IITC, Jun 2010, Dresde, Germany. ⟨10.1109/IITC.2010.5510735⟩. ⟨hal-00625314⟩
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