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Synchronization of Dictyostelium discoideum adhesion and spreading using electrostatic forces
M. Socol
,
C. Lefrou
,
F. Bruckert
,
D. Delabouglise
,
M. Weidenhaupt
et al.
Journal articles
hal-01067531v1
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The structural properties of GaN/AlN core-shell nanocolumn heterostructures
K. Hestroffer
,
R. Mata
,
D. Camacho
,
C. Leclere
,
G. Tourbot
et al.
Journal articles
istex
hal-01067031v1
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Etude et caractérisation des films minces lors du procédé de lithographie par nanoimpression
Frederic Lazzarino
Physique [physics]. Université Joseph-Fourier - Grenoble I, 2005. Français. ⟨NNT : ⟩
Theses
tel-00128711v1
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Impact of planarization soft layers on full 200mm wafer imprinting uniformity
Tanguy Lévéder
,
Stéfan Landis
,
Laurent Davoust
,
Nicolas Chaix
5th International Conference on Nanoimprint and Nanoprint Technology (NNT 2006), Nov 2006, San Fransisco, United States
Conference papers
hal-00203956v1
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Epitaxies Si/SiGe(C) pour transistors bipolaires avancés
Florence Brossard
Matière Condensée [cond-mat]. Université Joseph-Fourier - Grenoble I, 2007. Français. ⟨NNT : ⟩
Theses
tel-00200095v1
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Unified Analysis of Degraded Base Current in SiGe:C HBTs after Reverse and Forward Reliability Stress
M. Ruat
,
N. Revil
,
G. Pananakakis
,
G. Ghibaudo
IEEE Bipolar - BiCMOS Circuits and Technology Meeting (BCTM2006), 2006, Maastricht, Netherlands. pp.XX
Conference papers
hal-00147125v1
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Refined electrical analysis of two charge states transition characteristic of "borderless" silicon nitride
G. Beylier
,
S. Bruyère
,
D. Benoit
,
G. Ghibaudo
WoDIM 2006, 2006, Catania, Italy. pp.XX
Conference papers
hal-00147130v1
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New insight on Stress Induced Leakage Current on SiO2/HfO2 stack
M. Rafik
,
G. Ribes
,
G. Ghibaudo
XX, 2006, XX, France. pp.XX
Conference papers
hal-00147141v1
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Reliability characteristics of 150GHz fT/fmax Heterojunction Bipolar Transistors under reverse, forward and mixed-mode stress
M. Ruat
,
J. Bourgeat
,
M. Marin
,
G. Ghibaudo
,
N. Revil
et al.
Int. Reliability Workshop 2006, 2006, Stanford Sierra, United States. pp.XX
Conference papers
hal-00147143v1
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Impact of Film Thickness on LF Noise in SOI Devices
L. Zafari
,
J. Jomaah
,
G. Ghibaudo
International Conference on Solid State Devices and Materials (SSDM 2006), 2006, Japan, Japan. pp.XX
Conference papers
hal-00147157v1
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Drain and Gate Current Low Frequency Noise in Biaxially Strained Siliconn-MOSFETs with Ultrathin Gate Oxides
T. Contaret
,
T. Boutchacha
,
G. Ghibaudo
,
F. Bœuf
,
T. Skotniki
et al.
ULIS conference, 2006, Grenoble, France. pp.XX
Conference papers
hal-00146961v1
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Chalcopyrite thin-film solar cells by industry-compatible ink-based process
F. Roux
,
S. Amtablian
,
M. Anton
,
G. Besnard
,
L. Bilhaut
et al.
Journal articles
hal-00996640v1
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Influence of induced stress on enrichment kinetic during local Ge condensation of SiGe/SOI mesas
N. Dechoux
,
J.F Damlencourt
,
P. Rivallin
,
P. Brianceau
,
S. Bernasconi
et al.
Thin Solid Films, 2010, 518, pp.S92-S95
Journal articles
hal-00669421v1
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Dielectric relaxation in hafnium oxide: a study of transient currents and admittance spectroscopy in HfO2 metal-insulator-metal devices
C. Mannequin
,
P. Gonon
,
Corentin Vallée
,
A. Bsiesy
,
H. Grampeix
et al.
Journal of Applied Physics, 2011, pp.110 104108
Journal articles
hal-00669406v1
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Comparative study of non-polar switching behaviors of NiO and HfO2-based oxide resistive-RAMs
V. Jousseaume
,
A. Fantini
,
J.F. Nodin
,
C. Guedj
,
A. Persico
et al.
Solid-State Electronics, 2011, 58, pp.62-67
Journal articles
hal-00669415v1
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Investigation on full 6'' masks using innovative solutions for direct physico-chemical analyses of Mask backglass contamination and Haze
B. Pelissier
,
L. Dussault
,
F. Dufaye
,
S. Gough
,
J. Hamonne
et al.
Microelectronic Engineering, 2013, 104, pp.120-129
Journal articles
hal-00949974v1
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Comparative study on dry etching of α- and β-SiC nano-pillars
J.H. Choi
,
L. Latu-Romain
,
Edwige Bano
,
A. Henry
,
W.J. Lee
et al.
Materials Letters, 2012, pp.87 (2012) 9-12
Journal articles
hal-00778010v1
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Physics of Cellular Mechanosensing
A. Nicolas
,
S.A. Safran
De Gennes Days, Jan 2010, Dead see, Israel
Conference papers
hal-00649937v1
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Pre-Breakdown Negative Differential Resistance in thin oxide film: Conductive-Atomic Force Microscopy observation and modelling
P. Delcroix
,
S. Blonkowski
,
M. Kogelschatz
Journal of Applied Physics, 2011, pp.110, 034104
Journal articles
hal-00649928v1
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Mean time to failure distribution in thin oxide film: Observation at nano and devices scale and modelling using a filamentary growth model
P. Delcroix
,
S. Blonkowski
,
M. Kogelschatz
,
M. Rafik
SSDM Conference, Sep 2011, Nagoya, Japan
Conference papers
hal-00649930v1
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Ferromagnetic resonance in large arrays of dipolar-coupled micro- and nanostructures
N. Mikuszeit
,
A. Marty
,
A. Juvenal
,
J.P. Michel
,
B. Viala
et al.
Magnetism and Magnetic Materials, Nov 2013, Denver, United States
Conference papers
hal-00941675v1
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Study of HfO2 or HfSiOx /SrTiO3 and SrTiO3/Y2O3 MIM capacitors
Myrtil L. Kahn
,
Corentin Vallée
,
C. Dubourdieu
,
E. Defay
,
M. Bonvalot
et al.
53h National Symposium AVS, Nov 2006, San Francisco, United States
Conference papers
hal-00669567v1
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Patterning of GexSbxTey for non volatile phase-change memory applications
B. Salhi
,
T. Chevolleau
,
C. Vizioz
,
C. Jahan
,
S. Maitrejean
et al.
PESM 2012, Mar 2012, Grenoble, France
Conference papers
hal-00669521v1
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From Si nanowires to SiC nanostructures
L. Latu-Romain
,
M. Ollivier
,
S. David
,
M. Martin
,
T. Baron
et al.
E-MRS Spring Meeting, May 2012, Strasbourg, France
Conference papers
hal-00778020v1
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ANALYTICAL MODELS AND ELECTRICAL CHARACTERISATION OF ADVANCED MOSFETS IN THE QUASI BALLISTIC REGIME
Raphael Clerc
,
Gérard Ghibaudo
Journal articles
hal-00917094v1
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Study of the modifications induced by plasma VUV light on 193nm photoresist for the development of plasma cure treatments
M. Fouchier
,
E. Pargon
,
L. Azarnouche
,
O. Luere
,
K. Menguelti
et al.
63rd Gaseous Electronics Conference (GEC), Oct 2010, Paris, France
Conference papers
hal-00644015v1
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Dual wavelength cw microlaser for the generation of THz radiation
F. Pallas
,
E. Hérault
,
G. Grosa
,
J.-F. Roux
,
J.-L. Coutaz
et al.
"Dual wavelength cw microlaser for the generation of THz radiation", Sep 2010, Rome, Italy
Conference papers
hal-00603246v1
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Mobility coupling effects due to remote Coulomb scattering in thin-film FD-SOI CMOS devices
K. Bennamane
,
I. Ben Akkez
,
A. Cros
,
C. Fenouillet-Beranger
,
F. Balestra
et al.
Journal articles
hal-00994288v1
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Identification of halogen containing radicals in silicon etching plasmas and density measurement by UV broad band absorption spectroscopy
M. Kogelschatz
,
G. Cunge
,
N. Sadeghi
Journal articles
istex
hal-00944895v1
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Contact thickness effects in bottom-contact coplanar organic field-effect transistors
Yong Xu
,
W. Scheideler
,
Chuan Liu
,
F. Balestra
,
K. Tsukagoshi
et al.
Journal articles
hal-00994309v1
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