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Grain boundary composition and conduction in HfO2: An ab initio study
K.H. Xue
,
P. Blaise
,
L.R.C. Fonseca
,
G. Molas
,
E. Vianello
et al.
Journal articles
hal-01017441v1
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Physical model of dielectric charging in MEMS
A. Koszewski
,
Frédéric Souchon
,
C. Dieppedale
,
D. Bloch
,
T. Ouisse
et al.
Journal articles
hal-01067378v1
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The structural properties of GaN/AlN core-shell nanocolumn heterostructures
K. Hestroffer
,
R. Mata
,
D. Camacho
,
C. Leclere
,
G. Tourbot
et al.
Journal articles
istex
hal-01067031v1
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Anisotropic In distribution in InGaN core-shell nanowires
Cédric Leclere
,
N. A. Katcho
,
G. Tourbot
,
B. Daudin
,
M. G. Proietti
et al.
Journal articles
hal-01067036v1
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Diamagnetically trapped arrays of living cells above micromagnets
Paul Kauffmann
,
Ammara Ith
,
Daniel O'Brien
,
Victor Gaude
,
Florian Boué
et al.
Journal articles
hal-01067514v1
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Flow property measurement for nanoimprint simulation
Tanguy Lévéder
,
Stéfan Landis
,
Laurent Davoust
,
Nicolas Chaix
Journal articles
hal-00266796v1
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Hexagonal faceted SiC nanopillars fabricated by inductively coupled SF$_6$/O$_2$ plasma method
John H Choi
,
Laurence Latu-Romain
,
Thierry Baron
,
Thierry Chevolleau
,
Edwige Bano
et al.
Journal articles
hal-00650069v1
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Etude et caractérisation des films minces lors du procédé de lithographie par nanoimpression
Frederic Lazzarino
Physique [physics]. Université Joseph-Fourier - Grenoble I, 2005. Français. ⟨NNT : ⟩
Theses
tel-00128711v1
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Conception, montage et caractérisation d'un interféromètre achromatique pour l'étude de la lithographie à immersion à 193nm
Anne-Laure Charley
Micro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 2006. Français. ⟨NNT : ⟩
Theses
tel-00147894v1
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Mobility behavior in narrow -gate FETs devices
R. Ritzenthaleri C. Dupre X. Mescot O. Faynot T. Ernst J.C. Barbe C. Jahan L. Brevard F. Andrieux S. Deleonibus S. Cristoloveanu
,
R. Ritzenthaleri
,
C. Dupre
,
X. Mescot
,
O. Faynot
et al.
2006 IEEE Int. SOI Conf, 2006, Grenoble, France. pp.XX
Conference papers
hal-00146913v1
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Détermination expérimentale de la variation de la masse de conductivité des électrons dans un transistor MOS sous contrainte uniaxiale selon [110]
F. Rochette
,
M. Cassé
,
M. Mouis
,
G. Reimbold
,
F. Boulanger
et al.
Journées "Simulation et caractérisation des nanocomposants" du GDR Nanoélectronique, 2006, GRENOBLE, France. pp.XX
Conference papers
hal-00148274v1
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Flat-top and patterned-topped cone gratings for visible and mid-infrared antireflective properties
Jean-Baptiste Brueckner
,
Judikaël Le Rouzo
,
Ludovic Escoubas
,
Gerard Berginc
,
Cecile Gourgon
et al.
Journal articles
hal-01810798v1
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Study of carrier transport in strained and unstrained SOI tri-gate and omega-gate silicon nanowire MOSFETs
M. Koyama
,
M. Casse
,
R. Coquand
,
S. Barraud
,
C. Vizioz
et al.
Journal articles
hal-01002176v1
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Influence of device architecture on junction leakage in low-temperature process FDSOI MOSFETs
B. Sklenard
,
P. Batude
,
Q. Rafhay
,
I. Martin-Bragado
,
C.Q. Xu
et al.
Journal articles
hal-01002090v1
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Electrical characterization of memory cell structures using multiple tunnels junctions with embedded Si nanocrystals
D. Deleruyelle
,
D. Fraboulet
,
B. de Salvo
,
N. Buffet
,
D. Mariolle
et al.
Silicon Nano-electronics Workshop 2002, 2002, Honolulu, United States
Conference papers
hal-00484534v1
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High performance 0.25 µm SiGe and SiGe:C HBT's using non selective epitaxy
H. Baudry
,
B. Martinet
,
C. Fellous
,
O. Kemarrec
,
Y. Campidelli
et al.
ESSDERC 2001, 2001, Ireland
Conference papers
hal-00494523v1
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CFX kinetics, gas temperature and instabilities in a CF4 inductively coupled discharge
J.P Booth
,
H. Abada
,
P. Chabert
,
G. Cunge
48th National AVS symposium & Topical conferences, 2001, San Francisco, United States
Conference papers
hal-00494528v1
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Modification of spontaneous emission of (CdSe)ZnS nanocrystals embedded in nanoimprinted photonic crystals
N. Kehagias
,
V. Reboud
,
M. Zelsmann
,
M. Striccoli
,
M. Tamborra
et al.
Journal of Nanoscience and Nanotechnology, 2008, pp.8, 2 (2008) 535-539
Journal articles
hal-00394502v1
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Stamp replication for thermal and UV nanoimprint lithography using a UV sensitive silsesquioxane resist
N. Kehagias
,
V. Reboud
,
J. de Girolamo
,
M. Chouiki
,
M. Zelsmann
et al.
Microelectronic Engineering, 2009, pp.86, 4-6 (2009) 776-778
Journal articles
hal-00394507v1
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A model for cell-substrate mechanosensitivity
A. Nicolas
,
S.A. Safran
Workshop on cell motility,, 2008, torino, Italy
Conference papers
hal-00394511v1
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Fabrication of nanoimprinted functionnalized photonic crystals
V. Reboud
,
N. Kehagias
,
M. Striccoli
,
T. Placido
,
A. Panniello
et al.
Journées Nationales sur les Technologies Emergentes en micro-nanofabrication - JNTE 08, Nov 2008, toulouse, France
Conference papers
hal-00394544v1
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Spontaneous emission of nanocrystals in nanoimprinted photonic structures
V. Reboud
,
N. Kehagias
,
M. Zelsmann
,
M. Striccoli
,
M. Tamborra
et al.
Micro- and Nano-Engineering conference- MNE 2006, Sep 2006, barcelone, Spain
Conference papers
hal-00394523v1
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2D and 3D polymer photonic devices fabricated by nanoimprint lithography
N. Kehagias
,
V. Reboud
,
M. Zelsmann
,
M. Striccoli
,
M. Tamborra
et al.
Nanosciences & Nanotechnologies conference - NN 08, 2008, thessaloniki, Greece
Conference papers
hal-00394540v1
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High-resolution fused silica mold fabrication for UV-nanoimprint
P. Voisin
,
M. Zelsmann
,
C. Gourgon
,
J. Boussey-Said
Micro- and Nano-Engineering conference- MNE 2006, 2006, barcelone, Spain
Conference papers
hal-00394551v1
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High sensitive and etch-resistant material for UV-nanoimprint
P. Voisin
,
M. Zelsmann
,
R. Cluzel
,
E. Pargon
,
C. Gourgon
et al.
Micro- and Nano-Engineering conference- MNE 2006, 2006, barcelone, Spain
Conference papers
hal-00394552v1
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Diffractive optical element for sensor applications, fabricated by reverse contact UV Nanoimprint Lithography
N. Kehagias
,
G. Chansin
,
V. Reboud
,
T. Kehoe
,
M. Zelsmann
et al.
Nanoimprint and Nanoprint Technology conference - NNT 2006, Nov 2006, san francisco, United States
Conference papers
hal-00394555v1
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Low-k epoxy silsesquioxane resists for UV nanoimprint lithography
M. Chouiki
,
H. Ridaoui
,
M. Zelsmann
,
J. Boussey-Said
,
J. de Girolamo
et al.
Nanoimprint and Nanoprint Technology conference- NNT 2007, 2007, paris, France
Conference papers
hal-00394560v1
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Control of Silicon nanocrystals growth for nano-electronics devices
F. Mazen
,
T. Baron
,
L. Mollard
,
J.M Hartmann
203rd meeting of the Electrochemical Society, 2003, paris, France
Conference papers
hal-00485167v1
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Gate Etching for ULSI Technology : Critical Dimension Control in the sub 0.1 µm regime
X. Detter
,
L. Vallier
,
G. Cunge
,
O. Joubert
AVS, 48th International AVS symposium & Topical conferences, 2001, San Francisco, United States
Conference papers
hal-00486182v1
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Detection of defects on EUV lithography mask by dark field microscopy at 13.1 nm
V. Farys
,
C. Vannuffel
,
E. Quesnel
,
V. Muffato
,
P. Besson
et al.
7th International Conference on X-Ray Microscopy, XRM, 2002, grenoble, France
Conference papers
hal-00486213v1
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