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Article Dans Une Revue Surface Science Spectra Année : 2024

Tof-SIMS spectra of historical inorganic pigments: Copper-, zinc-, arsenic-, and phosphorus-containing pigments in positive polarity

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This paper focuses on eight pigments containing copper, zinc, arsenic, or phosphate, all manufactured following historical recipes. The positive polarity ToF-SIMS reference spectra using a Bi3 + primary ion species are presented here. Presented together, these spectra and corresponding tables of secondary ions provide a valuable help in differentiating these pigments, because copper, zinc, arsenic, or phosphate, combined with oxygen, share many mass interferences.
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hal-04637506 , version 1 (06-07-2024)

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Caroline Bouvier, Sebastiaan van Nuffel, Alain Brunelle. Tof-SIMS spectra of historical inorganic pigments: Copper-, zinc-, arsenic-, and phosphorus-containing pigments in positive polarity. Surface Science Spectra, 2024, 31 (2), pp.025001. ⟨10.1116/6.0003722⟩. ⟨hal-04637506⟩
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