Tof-SIMS spectra of historical inorganic pigments: Copper-, zinc-, arsenic-, and phosphorus-containing pigments in positive polarity
Résumé
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly used to analyze cultural heritage materials because it can simultaneously detect organic and inorganic materials while mapping them on a surface. The precise identification of a pigment in a specific layer of a painting or of remaining color on a statue can inform about the technique used or the time of manufacture as well as expose possible forgeries when anachronistic ingredients are identified. Reference spectra are required to confidently identify a given pigment using ToF-SIMS. This paper focuses on eight pigments containing copper, zinc, arsenic, or phosphate, all manufactured following historical recipes. The positive polarity ToF-SIMS reference spectra using a Bi3 + primary ion species are presented here. Presented together, these spectra and corresponding tables of secondary ions provide a valuable help in differentiating these pigments, because copper, zinc, arsenic, or phosphate, combined with oxygen, share many mass interferences.
Mots clés
- Verdigris
- CrossMark SIMS Peach black Bone black Realgar Bristol yellow medium Azurite Malachite Verdigris Zinc white Instrument: IONTOF TOF SIMS IV Cu Zn P Ca As S V Bi Cl Minor Species in Spectra: Hydrocarbon contamination
- CrossMark SIMS Peach black
- Bone black
- Realgar
- Bristol yellow medium
- Azurite
- Malachite
- Zinc white Instrument: IONTOF
- Cl Minor Species in Spectra: Hydrocarbon contamination
- Bi
- V
- S
- As
- Ca
- P
- Zn
- TOF SIMS IV Cu
Domaines
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