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Article Dans Une Revue IET Control Theory and Applications Année : 2023

Silent closure based pair verifier for fault pattern diagnosis of discrete event systems

Résumé

This paper addresses fault pattern diagnosis of discrete event systems, involving fault pattern detection and diagnosability. A fault pattern is modelled as a finite automaton whose accepted language is the objective to be diagnosed, representing the occurrence of complex or composite faults. A verifier for fault pattern detection based on the synchronous product of a system and a fault pattern is proposed. By removing all silent events, a silent closure is calculated based on the synchronous product, which offers computational advantages for systems that have a large number of silent events. An NSC/FSC pair verifier is then computed by taking the product of a normal silent closure and an accepted silent closure. By studying indeterminate cycles of the NSC/FSC pair verifier, necessary and sufficient verification conditions are established, asserting that a system is diagnosable with respect to a fault pattern if and only if there is no indeterminate cycle in the NSC/FSC pair verifier. It is shown that the proposed method requires polynomial time at most. Finally, a case study to illustrate the results is provided.
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Dates et versions

hal-04465356 , version 1 (04-03-2024)

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Ye Liang, Dimitri Lefebvre, Zhiwu Li. Silent closure based pair verifier for fault pattern diagnosis of discrete event systems. IET Control Theory and Applications, 2023, ⟨10.1049/cth2.12593⟩. ⟨hal-04465356⟩
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