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Pré-Publication, Document De Travail (Preprint/Prepublication) Année : 2018

Redox reaction enhanced Schottky contact at a LaNiO 3 (001)/Al interface

B Berini
  • Fonction : Auteur
Y Dumont
  • Fonction : Auteur
P Nukala
  • Fonction : Auteur
B Dkhil
  • Fonction : Auteur

Résumé

Emergent phenomena at interfaces between oxides and metals can appear due to charge transfer and mass transport that modify the bulk properties. By coating the metallic oxide LaNiO 3 by aluminium, we fabricated a junction exhibiting a diode-like behaviour. At the equilibrium, the interface is insulating. The metallic behaviour can be recovered by applying a voltage drop across the junction in one polarity only. The electrical properties in direct and reverse bias are investigated. The observed electro-resistive effect rises up to 10 5 % and can be interpreted in terms of (i) a spontaneous redox reaction occurring at the interface and (ii) its reversal induced by charge injection in direct bias.
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Dates et versions

hal-04381581 , version 1 (09-01-2024)

Identifiants

  • HAL Id : hal-04381581 , version 1

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J Scola, B Berini, Y Dumont, P Nukala, B Dkhil. Redox reaction enhanced Schottky contact at a LaNiO 3 (001)/Al interface. 2024. ⟨hal-04381581⟩
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