Unveiling the role of copper content in the crystal structure and phase stability of epitaxial Cu(In,Ga)S2 films on GaP/Si(001) - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Science in Semiconductor Processing Année : 2023

Unveiling the role of copper content in the crystal structure and phase stability of epitaxial Cu(In,Ga)S2 films on GaP/Si(001)

Résumé

This study examines the growth condition to obtain a single-phase Cu(In,Ga)S2 (CIGS) chalcopyrite film epitaxially grown by coevaporation on a GaP/Si(001) pseudo-substrate. In particular, we report the structural differences between KCN-etched Cu-rich and Cu-poor CIGS films coevaporated on GaP/Si(001) by 1-stage process. The Cu-poor CIGS film consists of at least three phases; the main crystal is found to be chalcopyrite-ordered, coexisting with In-rich CuIn5S8, and CuAu-ordered CuInS2, all sharing epitaxial relationships with each other and the GaP/Si(001) pseudo-substrate. On the other hand, the Cu-rich CIGS film is single-phase chalcopyrite and displays sharper X-ray diffraction peaks and a lower density of microtwin defects. The elimination of the secondary CuAu-ordered phase with Cu excess is demonstrated. In both films, the chalcopyrite crystal exclusively grows with its c-axis aligned with the out-of-plane direction of Si[001]. This study confirms prior findings on the thermodynamics of Cu-In-Ga-S and the stability of secondary phases.
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Dates et versions

hal-04186997 , version 1 (24-08-2023)

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Eugène Bertin, Olivier Durand, Antoine Létoublon, Charles Cornet, Ludovic Arzel, et al.. Unveiling the role of copper content in the crystal structure and phase stability of epitaxial Cu(In,Ga)S2 films on GaP/Si(001). Materials Science in Semiconductor Processing, 2023, 166, pp.107685. ⟨10.1016/j.mssp.2023.107685⟩. ⟨hal-04186997⟩
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