Device Reliability to Circuit Qualification: Insights and Challenges - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2023

Device Reliability to Circuit Qualification: Insights and Challenges

Résumé

Aging phenomena are first evidenced at device level to cell level considering a precise knowledge of the leading degradation mechanisms and interactions useful for processing optimization focusing performance vs. reliability requirements. Digital to analog circuits are then studied for product qualification based on the former results that needs specific methodologies adapted case by case with mission profile and the correlation between sensing parameter, accelerating factors for lifetime margin. This represents huge challenges for operational lifetime determination, considering top down and bottom up consistencies for relevant product qualification.
Fichier principal
Vignette du fichier
CACHO Florian - BRAVAIX Alain - IRW 2022 Final_300922.pdf (730.79 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04124032 , version 1 (09-06-2023)

Identifiants

Citer

F. Cacho, Alain Bravaix, T. Garba Seybou, H. Pitard, X. Federspiel, et al.. Device Reliability to Circuit Qualification: Insights and Challenges. International Integrated reliability Workshop (IIRW) 2022, Oct 2022, South Lake Tahoe, CA, USA, France. pp.1-7, ⟨10.1109/IIRW56459.2022.10077885⟩. ⟨hal-04124032⟩
7 Consultations
53 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More