Enhanced Resonant Raman scattering of GaN functional layers using Al thin films -a versatile tool for multilayer structure analysis - Archive ouverte HAL Access content directly
Conference Papers Year : 2021

Enhanced Resonant Raman scattering of GaN functional layers using Al thin films -a versatile tool for multilayer structure analysis

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hal-03410757 , version 1 (01-11-2021)

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  • HAL Id : hal-03410757 , version 1

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Alina Muravitskaya, Anna Rumyantseva, Atse Julien Eric N’dohi, Camille Sonneville, Dominique Planson, et al.. Enhanced Resonant Raman scattering of GaN functional layers using Al thin films -a versatile tool for multilayer structure analysis. ECSCRM2020-2021, Oct 2021, Tours, France. ⟨hal-03410757⟩
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