Analysis on Methods to obtain Lumped Parameters for an Inductive Coupling Device - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2013

Analysis on Methods to obtain Lumped Parameters for an Inductive Coupling Device

Résumé

A reliable lumped parameters model for an Inductive Coupling Device (ICD) is necessary for many reasons, mainly to develop a robust device. This paper compares an analytical method, a proposed method through Finite Element Method (FEM) and two different physical measurement methods. It shows the advantage of FEM over the analytical method, especially in situations with misalignments. This paper also outlines the two measurement methods using different measurement devices: impedance analyzer and vector network analyzer.
Fichier principal
Vignette du fichier
Compumag2013_DWF_AnalysisOnMethods.pdf (82.25 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-00807077 , version 1 (05-07-2013)

Identifiants

  • HAL Id : hal-00807077 , version 1

Citer

Daniela Wolter Ferreira, Moises Ferber de Vieira Lessa, Luiz Lebensztajn, Renan B. Müller, Laurent Krähenbühl, et al.. Analysis on Methods to obtain Lumped Parameters for an Inductive Coupling Device. Compumag 2013, Jun 2013, Budapest, Hungary. pp.674. ⟨hal-00807077⟩
296 Consultations
362 Téléchargements

Partager

Gmail Facebook X LinkedIn More