Analysis on Methods to obtain Lumped Parameters for an Inductive Coupling Device
Résumé
A reliable lumped parameters model for an Inductive Coupling Device (ICD) is necessary for many reasons, mainly to develop a robust device. This paper compares an analytical method, a proposed method through Finite Element Method (FEM) and two different physical measurement methods. It shows the advantage of FEM over the analytical method, especially in situations with misalignments. This paper also outlines the two measurement methods using different measurement devices: impedance analyzer and vector network analyzer.
Domaines
Energie électrique
Origine : Fichiers produits par l'(les) auteur(s)
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