Sub-domain finite element method for efficiently considering strong skin and proximity effects - Archive ouverte HAL
Article Dans Une Revue COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Année : 2007

Sub-domain finite element method for efficiently considering strong skin and proximity effects

Résumé

Purpose - This paper seeks to develop a sub-domain perturbation technique to efficiently calculate strong skin and proximity effects in conductors within frequency and time domain finite element (FE) analyses. Design/methodology/approach - A reference eddy current FE problem is first solved by considering perfect conductors. This is done via appropriate boundary conditions (BCs) on the conductors. Next the solution of the reference problem gives the source for eddy current FE perturbation sub-problems in each conductor then considered with a finite conductivity. Each of these problems requires an appropriate volume mesh of the associated conductor and its surrounding region. Findings - The skin and proximity effects in both active and passive conductors can be accurately determined in a wide frequency range, allowing for precise losses calculations in inductors as well as in external conducting pieces. Originality/value - The developed method allows one to accurately determine the current density distributions and ensuing losses in conductors of any shape, not only in the frequency domain but also in the time domain. Therefore, it extends the domain of validity and applicability of impedance-type BC techniques. It also offers an original way to uncouple FE regions that allows the solution process to be lightened, as well as efficient parameterized analyses on the signal form and the conductor characteristics.
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Dates et versions

hal-00179242 , version 1 (15-10-2007)

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Patrick Dular, Ruth V. Sabariego, Johan Gyselinck, Laurent Krähenbühl. Sub-domain finite element method for efficiently considering strong skin and proximity effects. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 2007, 26 (4), pp.974-985. ⟨10.1108/03321640710756311⟩. ⟨hal-00179242⟩
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