A new characterization technique for SOI wafers: Split C(V) in pseudo-MOSFET configuration
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C. Fernandez
- Function : Author
I. Ionica
- Function : Author
- PersonId : 170880
- IdHAL : irina-ionica
- IdRef : 108496651
F. Allibert
- Function : Author
G. Ghibaudo
- Function : Author
- PersonId : 170596
- IdHAL : gerard-ghibaudo
- ORCID : 0000-0001-9901-0679
- IdRef : 069253099
C. Mazure
- Function : Author
S. Cristoloveanu
- Function : Author
- PersonId : 172108
- IdHAL : sorin-cristoloveanu
- ORCID : 0000-0002-3576-5586
- IdRef : 030493188