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Journal Articles IEEE Electron Device Letters Year : 2013

RC Model for Frequency Dependence of Split C-V Measurements on Bare SOI Wafers

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hal-00994383 , version 1 (21-05-2014)

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A. Diab, I. Ionica, G. Ghibaudo, S. Cristoloveanu. RC Model for Frequency Dependence of Split C-V Measurements on Bare SOI Wafers. IEEE Electron Device Letters, 2013, 34 (6), pp.792-794. ⟨10.1109/LED.2013.2257663⟩. ⟨hal-00994383⟩
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