Journal Articles
IEEE Electron Device Letters
Year : 2013
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https://hal.science/hal-00994383
Submitted on : Wednesday, May 21, 2014-2:01:02 PM
Last modification on : Tuesday, February 7, 2023-2:44:50 PM
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A. Diab, I. Ionica, G. Ghibaudo, S. Cristoloveanu. RC Model for Frequency Dependence of Split C-V Measurements on Bare SOI Wafers. IEEE Electron Device Letters, 2013, 34 (6), pp.792-794. ⟨10.1109/LED.2013.2257663⟩. ⟨hal-00994383⟩
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