Journal Articles
Journal of Applied Physics
Year : 2008
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https://hal.science/hal-00391612
Submitted on : Thursday, June 4, 2009-11:45:18 AM
Last modification on : Tuesday, February 7, 2023-2:44:43 PM
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- HAL Id : hal-00391612 , version 1
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T.V. Chandrasekhar Rao, J. Antoszewski, L. Faraone, S. Cristoloveanu, T. Nguyen, et al.. Transport measurements in silicon-on-insulator films: Comparison of Hall effect, mobility spectrum, and pseudo-metal-oxide-semiconductor-field-effect-transistor techniques.. Journal of Applied Physics, 2008, 103 (XX, 034503), pp.1-5. ⟨hal-00391612⟩
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