Characterization of inhomogeneous weakly absorbing thin films by photothermal deflection spectroscopy, applications to hydrogenated amorphous silicon films
Résumé
We explore the possibilities offered by transverse photothermal deflection spectroscopy at low modulation frequencies for studying variations of the optical absorption coefficient of hydrogenated amorphous silicon thin films across their thickness, with a special emphasis on the low energy range.
Domaines
Articles anciens| Origine | Accord explicite pour ce dépôt |
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