Microstructure characterization of CIGS/GaP/Si tandem solar cells - Archive ouverte HAL
Poster Communications Year : 2024

Microstructure characterization of CIGS/GaP/Si tandem solar cells

Éric Gautron
Ludovic Arzel
  • Function : Author
  • PersonId : 1277336
Leo Choubrac
  • Function : Author
  • PersonId : 1277337
Emmanuel Cadel

Abstract

Conversion efficiencies of single-junction solar cells are very close to the theoretical Schockley-Queisser limit (~33%). Tandem solar cells can exceed this value combining a top cell optimized to absorb solar radiation in the UV/visible range with a bottom cell optimized for IR absorption. We have developed this type of cell using a Cu(In,Ga)S2 (CIGS) layer (band gap of 1.65-1.70 eV) deposited on a Si substrate (1.1 eV). Here, we combined different characterization techniques including S/TEM and TAP to try understanding the relation between microstructure and optoelectonic performances.
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Dates and versions

hal-04745370 , version 1 (20-10-2024)

Identifiers

  • HAL Id : hal-04745370 , version 1

Cite

Éric Gautron, Eugène Bertin, Ludovic Arzel, Leo Choubrac, Antoine Létoublon, et al.. Microstructure characterization of CIGS/GaP/Si tandem solar cells. European Microscopy Congress (EMC) 2024, Aug 2024, Copenhagen, Denmark. ⟨hal-04745370⟩
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