This work proposes a novel approach to advance non-contact millimeter-wave sensing capabilities through the fusion of microwave characterization techniques with nanorobotics. Firstly, we introduce a WR15 waveguide six-port radar operating around 60 GHz for precise measurement of free-space reflection coefficients. Precise knowledge of the standoff distance between the antenna and the material under test (MUT) directly impacts the accuracy for extracting electromagnetic properties of the MUT. Therefore, the MUT is mounted on a piezoelectric nano-positionning stage with resolution of ±30 nm over a centimeter-scale distance.