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Article Dans Une Revue ACS Applied Electronic Materials Année : 2024

Charge Collection Efficiency of Single GaN Core–Shell Wires Assessed by High-Precision Ion-Beam-Induced Charge Measurements

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hal-04476034 , version 1 (24-02-2024)

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Dirkjan Verheij, Milan Vićentijević, Milko Jakšić, Marco Peres, Luís Cerqueira Alves, et al.. Charge Collection Efficiency of Single GaN Core–Shell Wires Assessed by High-Precision Ion-Beam-Induced Charge Measurements. ACS Applied Electronic Materials, 2024, ⟨10.1021/acsaelm.3c01584⟩. ⟨hal-04476034⟩
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