Fault pattern diagnosis of discrete-event systems by means of logical verifiers - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IFAC-PapersOnLine Année : 2022

Fault pattern diagnosis of discrete-event systems by means of logical verifiers

Ye Liang
Zhiwu Li

Résumé

In this paper, a diagnosis problem of discrete event systems (DESs) is considered, including fault pattern detection and diagnosability. A fault pattern in a DES is modeled by an automaton that represents the occurrence of complex faults, i.e., the language of the automaton is the objective to be diagnosed. To solve the problem of fault pattern detection, two verifiers are provided. The former, based on state isolation, can perform state estimation in an efficient manner recursively such that at any point during recursion, the states can be isolated. The latter, inspired by the notion of synchronous product, allows us to concisely synthesize and analyze the system information. Comparing these two verifiers, it is found that the two structures are equivalent from the perspective of pattern detection and diagnosability. On the basis of aforementioned verifier structures, we establish their respective diagnosers, and develop algorithms for fault pattern diagnosability.
Fichier principal
Vignette du fichier
1-s2.0-S2405896322005717-main.pdf (475.92 Ko) Télécharger le fichier
Origine : Fichiers éditeurs autorisés sur une archive ouverte
Licence : CC BY NC ND - Paternité - Pas d'utilisation commerciale - Pas de modification

Dates et versions

hal-04468870 , version 1 (04-03-2024)

Licence

Paternité - Pas d'utilisation commerciale - Pas de modification

Identifiants

Citer

Ye Liang, Dimitri Lefebvre, Zhiwu Li. Fault pattern diagnosis of discrete-event systems by means of logical verifiers. IFAC-PapersOnLine, 2022, 55 (6), pp.551-556. ⟨10.1016/j.ifacol.2022.07.186⟩. ⟨hal-04468870⟩
18 Consultations
2 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More