( 12 ) United States Patent : Measurement system and temperature and/or shape change sensor using brillouin scattering analysis - Archive ouverte HAL Accéder directement au contenu
Brevet Année : 2020

( 12 ) United States Patent : Measurement system and temperature and/or shape change sensor using brillouin scattering analysis

Résumé

A measurement system for performing measurement by Brillouin scattering analysis, the system comprising a laser emitter device (10) configured to emit an incident wave (ν0) and a reference wave (ν0−νB), the incident wave presenting an incident frequency (ν0) and the reference wave presenting a reference frequency (ν0−νB), the reference frequency (ν0−νB) being shifted from the incident frequency (ν0) by a predetermined value (νB). The system is configured to: project the incident wave (ν0) into the optical fiber (25); receive in return a backscattered wave (ν0−νS); generate a composite wave (ν0-S, 0-B) combining the backscattered wave (ν0−νS) and the reference wave (S0−νB); and determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave (ν0-S, 0-B). Advantageously, the incident wave and the reference wave come from a dual-frequency vertical-cavity surface-emitting laser source (12) forming part of the laser emitter device.
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Dates et versions

hal-04433544 , version 1 (02-02-2024)

Identifiants

  • HAL Id : hal-04433544 , version 1

Citer

Aghiad Khadour, Jean-Louis Oudar. ( 12 ) United States Patent : Measurement system and temperature and/or shape change sensor using brillouin scattering analysis. France, Patent n° : US 10,697,807 B2. 2020. ⟨hal-04433544⟩
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