Modeling of Diffusion-Collection Mechanisms in Semiconductor Devices Submitted to Ionizing Radiation - Archive ouverte HAL Accéder directement au contenu
Chapitre D'ouvrage Année : 2024

Modeling of Diffusion-Collection Mechanisms in Semiconductor Devices Submitted to Ionizing Radiation

Résumé

When an ionizing particle passes through a semiconductor device, it transfers energy and generates electron-hole pairs along its path. The excess carriers are subsequently transported throughout the semiconductor’s volume via ambipolar diffusion until they either recombine or are collected and extracted typically by a biased contact or a reverse-biased p-n junction. To predict the transient electrical behavior of complementary metal-oxide semiconductor (CMOS) devices and circuits when exposed to ionizing radiation and assess their soft error rate (SER), it is fundamental to accurately model these diverse physical processes. In this chapter, we present a comprehensive modeling and analysis of the diffusion and collection mechanisms of radiation-induced charges through a semiconductor device. Analytical formulations of the collected charge, collection current, and collection velocity are developed. These equations are further employed to establish an analytical formulation of the soft error rate (SER), explaining its exponential dependence on the critical charge of the circuit. This formulation also links the SER to various physical and technological parameters, as well as to the characteristics of the radiation.
Fichier principal
Vignette du fichier
Chapter_2024_Munteanu_Autran_HAL.pdf (3.97 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04400965 , version 1 (17-01-2024)

Identifiants

Citer

Daniela Munteanu, Jean-Luc Autran. Modeling of Diffusion-Collection Mechanisms in Semiconductor Devices Submitted to Ionizing Radiation. Advances in Semiconductor Physics and Devices, IntechOpen, 2024, ⟨10.5772/intechopen.1003991⟩. ⟨hal-04400965⟩
28 Consultations
24 Téléchargements

Altmetric

Partager

Gmail Mastodon Facebook X LinkedIn More