Piezo‐Semiconductor Coupled Model for the Simulation of Zinc Oxide 1–3 Piezo‐Composite
Résumé
Abstract Semiconducting effects in zinc oxide nanowires‐based nanogenerators greatly impact their performances. A coupled model integrating piezoelectric and semiconducting properties is developed with a finite element method to better understand the phenomena involved in this kind of device made with a process including chemical bath deposition of the nanostructures and their polymer encapsulation. Free carriers and surface traps are taken into account to give some keys to explain differences between previous theoretical and experimental works. This model is first validated on a single nanowire with a 10 16 cm −3 n‐doping level by comparison with analytical calculations. For this comparison, surface traps are not taken into account as no analytical solution is available considering them. Second, n‐doping levels (between 10 12 and 10 18 cm −3 ) and surface traps densities (between 10 8 and 10 12 cm −2 ) lead to variations of the generated piezopotential of two orders of magnitude. The control of these two semiconducting properties is a real challenge for this kind of application. Furthermore, simulation results show that the benefic effect of 1–3 piezo‐composite is still present even for a high n‐doping level of 10 18 cm −3 .
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