Repulsive Force for Micro- and Nano-Non-Contact Manipulation
Résumé
Non-contact positioning of micro-objects using electric fields has
been widely explored, based on several physical principles such as
electrophoresis, dielectrophoresis (DEP) or optical
dielectrophoresis (ODEP), in which the actuation force is induced
by an electric charge or an electric dipole placed in an electric
field. In this paper, we introduce a new way to control charges in
non-contact positioning of micro-objects using chemical
functionalization (3-aminopropyl)triethoxysilane - APTES) able to
localize charges on a substrate and/or on a micro-object. We
demonstrate that this functionalization in a liquid with a low
ionic strength is able to concentrate a significant amount of
electric charges on surfaces generating an electric field over a
long distance (about 10 microns), also call a large exclusion zone
(EZ). A model is proposed and validated with electrostatic force
measurements between substrate and microparticles (diameter up to
40µm). We demonstrate that the magnitude of the force and the force
range decrease rapidly when the ionic strength of the medium
increases. Based on the proposed model, we show that this new way
to localize charges on micro-objects may be used for non-contact
positioning.
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