Wavefront Microscopy Using Quadriwave Lateral Shearing Interferometry: From Bioimaging to Nanophotonics
Résumé
Common cameras are only sensitive to the intensity of light, discarding an essential feature of a light wave: its phase profile, or equivalently, its wavefront profile. This Review focuses on a rising wavefront imaging technique called quadriwave lateral shearing interferometry (QLSI), based on the simple use of a 2-dimensional diffraction grating, aka a cross-grating, in front of a regular camera. We detail the working principle of QLSI and its implementation on an optical microscope. We highlight its microscopy applica- tions in bioimaging and nanophotonics, in particular for the characterization of living cells, nanoparticles, 2D-materials, metasurfaces, microscale temperature gradients and surface topography. Finally, we draw a critical comparison of QLSI with current quantitative phase microscopy techniques, namely DHM, SLIM and DPM.
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Licence |
Domaine public
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