Journal Articles
Solid-State Electronics
Year : 2019
Silvano De Franceschi : Connect in order to contact the contributor
https://hal.science/hal-03541771
Submitted on : Monday, January 24, 2022-8:16:13 PM
Last modification on : Monday, March 13, 2023-10:56:16 AM
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Arnout Beckers, Farzan Jazaeri, Heorhii Bohuslavskyi, Louis Hutin, Silvano de Franceschi, et al.. Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures. Solid-State Electronics, 2019, 159, pp.106-115. ⟨10.1016/j.sse.2019.03.033⟩. ⟨hal-03541771⟩
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