Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures - Archive ouverte HAL Access content directly
Journal Articles Solid-State Electronics Year : 2019

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hal-03541771 , version 1 (24-01-2022)

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Arnout Beckers, Farzan Jazaeri, Heorhii Bohuslavskyi, Louis Hutin, Silvano de Franceschi, et al.. Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures. Solid-State Electronics, 2019, 159, pp.106-115. ⟨10.1016/j.sse.2019.03.033⟩. ⟨hal-03541771⟩
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