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N°Spécial De Revue/Special Issue Microelectronics Reliability Année : 2021

Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

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hal-03408633 , version 1 (29-10-2021)

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Nathalie Labat, François Marc, Hélène Frémont, Nicolas Nolhier. Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. Microelectronics Reliability, pp.114403, 2021, ⟨10.1016/j.microrel.2021.114403⟩. ⟨hal-03408633⟩
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