Bias-dependence of surface charge at low temperature in GaN self-switching diodes - Archive ouverte HAL
Communication Dans Un Congrès Année : 2021

Bias-dependence of surface charge at low temperature in GaN self-switching diodes

E. Perez-Martin
  • Fonction : Auteur
I. Iniguez-De-La-Torre
  • Fonction : Auteur
T. Gonzalez
J. Mateos

Résumé

In this work, with the help of a semi-classical two-dimensional Monte Carlo (MC) simulator, we study the DC current-voltage curves of Self-Switching Diodes (SSDs) fabricated on an AlGaN/GaN heterostructure from 100 K up to room temperature. Due to the very narrow channel of the SSDs, the presence of surface effects plays a key role not only on their DC behavior but also on their RF detection performance. The evolution with temperature of the negative surface charge density σ at the etched sidewalls of the SSD is the key quantity to explain the measurements. At 300 K, MC simulations with a constant value of σ are able to replicate very satisfactorily the experiments. However, to reproduce the shape of the I-V curve at low temperatures, a more realistic approach, where σ depends not only on T, but also on the applied bias V, is necessary.
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Dates et versions

hal-03362256 , version 1 (04-10-2021)

Identifiants

Citer

E. Perez-Martin, I. Iniguez-De-La-Torre, T. Gonzalez, Christophe Gaquière, J. Mateos. Bias-dependence of surface charge at low temperature in GaN self-switching diodes. 13th Spanish Conference on Electron Devices, CDE 2021, Jun 2021, Sevilla, Spain. pp.90-93, ⟨10.1109/CDE52135.2021.9455737⟩. ⟨hal-03362256⟩
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