Journal Articles
IEEE Design & Test
Year : 2021
SEBASTIEN LALLECHERE : Connect in order to contact the contributor
https://hal.science/hal-03274898
Submitted on : Wednesday, June 30, 2021-3:17:31 PM
Last modification on : Friday, March 24, 2023-2:53:22 PM
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Fayu Wan, Taochen Gu, Sebastien Lallechere, Preeti Thakur, Atul Thakura, et al.. Design and Test of Innovative Three Couplers-Based Bandpass Negative Group Delay Active Circuit. IEEE Design & Test, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3079178⟩. ⟨hal-03274898⟩
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