Journal Articles
IEEE Design & Test
Year : 2021
SEBASTIEN LALLECHERE : Connect in order to contact the contributor
https://hal.science/hal-03274868
Submitted on : Wednesday, June 30, 2021-2:59:07 PM
Last modification on : Friday, March 24, 2023-2:53:22 PM
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Blaise Ravelo, Fayu Wan, Sebastien Lallechere, Glauco Fontgalland, Wenceslas Rahajandraibe. Design and Test of Crab-Shape Negative Group Delay Circuit. IEEE Design & Test, 2021, pp.1-1. ⟨10.1109/MDAT.2021.3053556⟩. ⟨hal-03274868⟩
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