Defect densities analysis in thin (i) a-Si:H passivation layer inserted in a-Si:H/c-Si heterojunction solar cells using coplanar conductance measurements : a temperature dependence study - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2020

Defect densities analysis in thin (i) a-Si:H passivation layer inserted in a-Si:H/c-Si heterojunction solar cells using coplanar conductance measurements : a temperature dependence study

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hal-02946579 , version 1 (23-09-2020)

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Sylvain Le Gall, Alexandra Levtchenko, Rudolf Brüggemann, Jean-Paul Kleider. Defect densities analysis in thin (i) a-Si:H passivation layer inserted in a-Si:H/c-Si heterojunction solar cells using coplanar conductance measurements : a temperature dependence study. 37th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2020), Sep 2020, Lisbon, Portugal. ⟨hal-02946579⟩
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