Admittivity imaging from multi-frequency micro-electrical impedance tomography - Archive ouverte HAL Access content directly
Journal Articles Journal of Mathematical Analysis and Applications Year : 2017

Dates and versions

hal-02352559 , version 1 (06-11-2019)

Identifiers

Cite

Habib Ammari, Laure Giovangigli, Loc Hoang Nguyen, Jin-Keun Seo. Admittivity imaging from multi-frequency micro-electrical impedance tomography. Journal of Mathematical Analysis and Applications, 2017, 449 (2), pp.1601-1618. ⟨10.1016/j.jmaa.2017.01.004⟩. ⟨hal-02352559⟩
31 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More