In recent years, thanks to the rapid advances in technology, the optoelectronic devices become more and more complex with strong interactions (e.g. multi-chip module, chip-onchip integration, photonic integrated circuit, etc) and require high performance levels. One of the most recognized challenges of such a system is its reliability assessment. In that way, the objective of this paper is to develop of an accelerated degradation testing model allowing to evaluate the reliability of an optoelectronic system. Firstly, the stochastic interactions between components under a given stress mode are modeled and formulated. Next, a degradation model considering the stochastic interactions between components is developed for each component. Then, reliability models for both component and system levels are investigated. Finally, a numerical example of a system on chip is conducted to illustrate the uses and advantages of the proposed models