(Invited) Modeling the Influence of Interface Traps on the Transfer Characteristics of InAs Tunnel-FETs and MOSFETs - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue ECS Transactions Année : 2014

(Invited) Modeling the Influence of Interface Traps on the Transfer Characteristics of InAs Tunnel-FETs and MOSFETs

Résumé

We present a numerical study based on a full quantum transport model to investigate the effects of interface traps in nanowire InAs Tunnel-FETs and MOSFETs by varying the trap energy level, its position and the working temperature. Our 3-D self-consistent simulations show that in Tunnel-FETs even a single trap can deteriorate the inverse subthreshold slope of a nanowire InAs Tunnel-FET; shallow traps have the largest impact on subthreshold slopes; and the inelastic phonon-assisted tunneling through interface traps results in a temperature dependence of the Tunnel-FET characteristics. The effect of traps on the MOSFET characteristics is less dramatic and mainly limited on a degradation of the voltage swing which can be effectively countered out by an aggressive oxide thickness scaling. Finally, we present a comparative analysis of the impact of interface traps on the performance variability of nanowire InAs Tunnel-FETs and MOSFETs by considering several random distributions of traps.
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Dates et versions

hal-02065902 , version 1 (13-03-2019)

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M. Pala, D. Esseni. (Invited) Modeling the Influence of Interface Traps on the Transfer Characteristics of InAs Tunnel-FETs and MOSFETs. ECS Transactions, 2014, 61 (2), pp.237-251. ⟨10.1149/06102.0237ecst⟩. ⟨hal-02065902⟩
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