<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-02065902</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-14T01:31:48+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">(Invited) Modeling the Influence of Interface Traps on the Transfer Characteristics of InAs Tunnel-FETs and MOSFETs</title>
            <author role="aut">
              <persName>
                <forename type="first">M.</forename>
                <surname>Pala</surname>
              </persName>
              <email type="md5">3763ceebf5f2b9744e05aaca938c6de5</email>
              <email type="domain">c2n.upsaclay.fr</email>
              <idno type="idhal" notation="string">marco-pala</idno>
              <idno type="idhal" notation="numeric">178951</idno>
              <idno type="halauthorid" notation="string">517399-178951</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/D-6579-2013</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-5733-515X</idno>
              <idno type="GOOGLE SCHOLAR">https://scholar.google.com/citations?hl=it&amp;user=2zbqF-kAAAAJ&amp;view_op=list_works&amp;sortby=pubdate</idno>
              <idno type="IDREF">https://www.idref.fr/185867715</idno>
              <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/D-6579-2013</idno>
              <affiliation ref="#struct-48098"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">D.</forename>
                <surname>Esseni</surname>
              </persName>
              <idno type="halauthorid">617867-0</idno>
              <affiliation ref="#struct-358631"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Frédérique</forename>
                <surname>Ducroquet</surname>
              </persName>
              <email type="md5">de61d4b3fe59ef2c58557b0899f53fe5</email>
              <email type="domain">cnrs.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2019-03-13 09:18:14</date>
              <date type="whenModified">2025-09-27 18:39:49</date>
              <date type="whenReleased">2019-03-13 09:18:14</date>
              <date type="whenProduced">2014-05-05</date>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="200553">
                <persName>
                  <forename>Frédérique</forename>
                  <surname>Ducroquet</surname>
                </persName>
                <email type="md5">de61d4b3fe59ef2c58557b0899f53fe5</email>
                <email type="domain">cnrs.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-02065902</idno>
            <idno type="halUri">https://hal.science/hal-02065902</idno>
            <idno type="halBibtex">pala:hal-02065902</idno>
            <idno type="halRefHtml">&lt;i&gt;ECS Transactions&lt;/i&gt;, 2014, 61 (2), pp.237-251. &lt;a target="_blank" href="https://dx.doi.org/10.1149/06102.0237ecst"&gt;&amp;#x27E8;10.1149/06102.0237ecst&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">ECS Transactions, 2014, 61 (2), pp.237-251. &amp;#x27E8;10.1149/06102.0237ecst&amp;#x27E9;</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="UNIV-SAVOIE">Université Savoie Mont Blanc</idno>
            <idno type="stamp" n="UGA">HAL Grenoble Alpes</idno>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="UNIV-GRENOBLE1">Université Joseph Fourier - Grenoble I</idno>
            <idno type="stamp" n="INPG">Institut polytechnique de Grenoble</idno>
            <idno type="stamp" n="IMEP-LAHC" corresp="UNIV-SAVOIE">IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation</idno>
            <idno type="stamp" n="CMNE">CMNE</idno>
            <idno type="stamp" n="USMB-COMUE">Université Savoie Mont Blanc - UGA [* - 2019]</idno>
            <idno type="stamp" n="CROMA" corresp="UNIV-SAVOIE">Centre de Radiofréquences, Optique et Micro-nanoélectronique des Alpes</idno>
            <idno type="stamp" n="TEST-UGA">TEST-UGA</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">(Invited) Modeling the Influence of Interface Traps on the Transfer Characteristics of InAs Tunnel-FETs and MOSFETs</title>
                <author role="aut">
                  <persName>
                    <forename type="first">M.</forename>
                    <surname>Pala</surname>
                  </persName>
                  <email type="md5">3763ceebf5f2b9744e05aaca938c6de5</email>
                  <email type="domain">c2n.upsaclay.fr</email>
                  <idno type="idhal" notation="string">marco-pala</idno>
                  <idno type="idhal" notation="numeric">178951</idno>
                  <idno type="halauthorid" notation="string">517399-178951</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/D-6579-2013</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-5733-515X</idno>
                  <idno type="GOOGLE SCHOLAR">https://scholar.google.com/citations?hl=it&amp;user=2zbqF-kAAAAJ&amp;view_op=list_works&amp;sortby=pubdate</idno>
                  <idno type="IDREF">https://www.idref.fr/185867715</idno>
                  <idno type="RESEARCHERID">http://www.researcherid.com/rid/http://www.researcherid.com/rid/D-6579-2013</idno>
                  <affiliation ref="#struct-48098"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">D.</forename>
                    <surname>Esseni</surname>
                  </persName>
                  <idno type="halauthorid">617867-0</idno>
                  <affiliation ref="#struct-358631"/>
                </author>
              </analytic>
              <monogr>
                <idno type="localRef">CMNE</idno>
                <idno type="halJournalId" status="VALID">38833</idno>
                <idno type="issn">1938-5862</idno>
                <idno type="eissn">1938-6737</idno>
                <title level="j">ECS Transactions</title>
                <imprint>
                  <publisher>Electrochemical Society, Inc.</publisher>
                  <biblScope unit="volume">61</biblScope>
                  <biblScope unit="issue">2</biblScope>
                  <biblScope unit="pp">237-251</biblScope>
                  <date type="datePub">2014-05-05</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1149/06102.0237ecst</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <classCode scheme="halDomain" n="spi.nano">Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>We present a numerical study based on a full quantum transport model to investigate the effects of interface traps in nanowire InAs Tunnel-FETs and MOSFETs by varying the trap energy level, its position and the working temperature. Our 3-D self-consistent simulations show that in Tunnel-FETs even a single trap can deteriorate the inverse subthreshold slope of a nanowire InAs Tunnel-FET; shallow traps have the largest impact on subthreshold slopes; and the inelastic phonon-assisted tunneling through interface traps results in a temperature dependence of the Tunnel-FET characteristics. The effect of traps on the MOSFET characteristics is less dramatic and mainly limited on a degradation of the voltage swing which can be effectively countered out by an aggressive oxide thickness scaling. Finally, we present a comparative analysis of the impact of interface traps on the performance variability of nanowire InAs Tunnel-FETs and MOSFETs by considering several random distributions of traps.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-48098" status="OLD">
          <idno type="IdRef">18021621X</idno>
          <idno type="ISNI">0000 0004 0382 8823</idno>
          <idno type="RNSR">200111812P</idno>
          <idno type="ROR">https://ror.org/03taa9n66</idno>
          <orgName>Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation</orgName>
          <orgName type="acronym">IMEP-LAHC</orgName>
          <date type="start">2007-01-01</date>
          <date type="end">2015-12-31</date>
          <desc>
            <address>
              <addrLine>Site Grenoble : Grenoble INP - Minatec : 3, Parvis Louis Néel - CS 50257 - 38016 Grenoble Cedex 1 / Site Chambéry : Université de Savoie - F73376 Le Bourget du Lac Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://imep-lahc.grenoble-inp.fr/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-51016" type="direct"/>
            <relation active="#struct-89889" type="direct"/>
            <relation active="#struct-300275" type="direct"/>
            <relation active="#struct-432896" type="direct"/>
            <relation name="UMR5130" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-358631" status="VALID">
          <orgName>Università degli Studi di Udine - University of Udine [Italie]</orgName>
          <desc>
            <address>
              <addrLine>via Palladio 8, 33100 Udine</addrLine>
              <country key="IT"/>
            </address>
            <ref type="url">http://www.uniud.it/en/uniud-international?set_language=en</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-51016" status="OLD">
          <idno type="IdRef">026404796</idno>
          <idno type="ROR">https://ror.org/02aj0kh94</idno>
          <orgName>Université Joseph Fourier - Grenoble 1</orgName>
          <orgName type="acronym">UJF</orgName>
          <date type="end">2015-12-31</date>
          <desc>
            <address>
              <addrLine>BP 53 - 38041 Grenoble Cedex 9</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.ujf-grenoble.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-89889" status="OLD">
          <idno type="IdRef">026388804</idno>
          <idno type="ROR">https://ror.org/05sbt2524</idno>
          <orgName>Institut polytechnique de Grenoble - Grenoble Institute of Technology</orgName>
          <orgName type="acronym">Grenoble INP</orgName>
          <date type="start">2007-01-01</date>
          <date type="end">2019-12-31</date>
          <desc>
            <address>
              <addrLine>46 avenue Félix Viallet 38031 Grenoble Cedex 1</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.grenoble-inp.fr/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-300275" status="OLD">
          <idno type="IdRef">026388804</idno>
          <orgName>Institut National Polytechnique de Grenoble</orgName>
          <orgName type="acronym">INPG</orgName>
          <date type="end">2006-12-31</date>
          <desc>
            <address>
              <addrLine>46 avenue Félix Viallet 38031 Grenoble Cedex 1</addrLine>
              <country key="FR"/>
            </address>
          </desc>
        </org>
        <org type="institution" xml:id="struct-432896" status="VALID">
          <idno type="ROR">https://ror.org/04gqg1a07</idno>
          <orgName>Université Savoie Mont Blanc</orgName>
          <orgName type="acronym">USMB [Université de Savoie] [Université de Chambéry]</orgName>
          <date type="start">1979-10-01</date>
          <desc>
            <address>
              <addrLine>27, rue Marcoz - 73000 Chambéry</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.univ-smb.fr</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>