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Article Dans Une Revue Materials Science Forum Année : 2018

Electric Field Characterization of Diamond Metal Semiconductor Field Effect Transistors Using Electron Beam Induced Current

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hal-01990947 , version 1 (23-01-2019)

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Khaled Driche, Hitoshi Umezawa, Shinya Ohmagari, Hajime Okumura, Yoshiaki Mokuno, et al.. Electric Field Characterization of Diamond Metal Semiconductor Field Effect Transistors Using Electron Beam Induced Current. Materials Science Forum, 2018, 924, pp.935-938. ⟨10.4028/www.scientific.net/MSF.924.935⟩. ⟨hal-01990947⟩
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