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Conference Papers Year : 2012

Real-cases of electromagnetic immunity and reliability in embedded electronics architectures

Jean-Marc Diénot
Emmanuel Batista
  • Function : Author

Abstract

This papers concerns works about electromagnetic immunity and reliability investigations on electronics devices, combined with different physical impacts as temperature.
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Dates and versions

hal-01977489 , version 1 (10-01-2019)

Identifiers

  • HAL Id : hal-01977489 , version 1
  • OATAO : 8345

Cite

Jean-Marc Diénot, Emmanuel Batista. Real-cases of electromagnetic immunity and reliability in embedded electronics architectures. EUROEM 2012, Jul 2012, Toulouse, France. pp.87. ⟨hal-01977489⟩
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