PWM power cycling test for IGBT modules operating at ambient temperature - Archive ouverte HAL Access content directly
Conference Papers Year : 2012
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hal-01653101 , version 1 (01-12-2017)

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  • HAL Id : hal-01653101 , version 1

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Mohamed Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, B. Pouderoux, B. Boudart, et al.. PWM power cycling test for IGBT modules operating at ambient temperature. 4th International Conference on Accelerated Life Testing and Degradation Models: Industry, Medicine, and Social Science, 2012, Rennes, France. ⟨hal-01653101⟩
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