Raman characterization of Mg+ ion-implanted GaN - Archive ouverte HAL Access content directly
Conference Papers Year : 2003
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hal-01649531 , version 1 (27-11-2017)

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  • HAL Id : hal-01649531 , version 1

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B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson. Raman characterization of Mg+ ion-implanted GaN. 7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩
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