Conference Papers
Year : 2003
Bertrand BOUDART : Connect in order to contact the contributor
https://hal.science/hal-01649531
Submitted on : Monday, November 27, 2017-3:32:40 PM
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B. Boudart, Yannick Guhel, J. C. Pesant, Paul Dhamelincourt, M.A. Poisson. Raman characterization of Mg+ ion-implanted GaN. 7th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors, 2003, Lille, France. ⟨hal-01649531⟩
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