Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N

Y. Guhel; B. Boudart; E. Delos; Marie Germain; Z. Bougrioua

doi:10.1016/j.microrel.2005.08.008

Journal Articles Microelectronics Reliability Year : 2006

Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N

(1) , (1) , (2) , ,

1
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Y. Guhel

Function : Author

Laboratoire Universitaire des Sciences Appliquées de Cherbourg

B. Boudart

Function : Author
PersonId : 16148
IdHAL : bertrand-boudart
IdRef : 060260092

Laboratoire Universitaire des Sciences Appliquées de Cherbourg

E. Delos

Function : Author

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

Marie Germain

Function : Author
PersonId : 170960
IdHAL : marie-germain
ORCID : 0000-0001-7382-1609
IdRef : 176579958

Z. Bougrioua

Function : Author
PersonId : 180745
IdHAL : zahia-bougrioua
ORCID : 0000-0003-3579-7091
IdRef : 113374135

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

Bertrand BOUDART : Connect in order to contact the contributor

https://hal.science/hal-01646876

Submitted on : Thursday, November 23, 2017-7:50:41 PM

Last modification on : Wednesday, January 24, 2024-9:54:18 AM

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hal-01646876 , version 1 (23-11-2017)

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HAL Id : hal-01646876 , version 1
DOI : 10.1016/j.microrel.2005.08.008

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Y. Guhel, B. Boudart, E. Delos, Marie Germain, Z. Bougrioua. Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N. Microelectronics Reliability, 2006, 46 (5-6), pp.786 - 793. ⟨10.1016/j.microrel.2005.08.008⟩. ⟨hal-01646876⟩

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Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N

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