Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation - Archive ouverte HAL
Article Dans Une Revue IEEE Transactions on Electron Devices Année : 2017

Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation

Résumé

We investigated a methodology to design light-triggered thyristors thanks to TCAD. The simulation model accuracy, especially the holding current and the minimum incident light intensity to turn-ON, were compared with experimental results. The influence of SiC epitaxial layer lifetime and the incident light properties (wavelength and intensity) on the optically triggered 4H-SiC thyristor characteristics have been studied by simulation. We considered the wavelength dependence of quantum efficiency, penetration depth, and photon energy. The holding current and turn-ON time depends on the lifetime. The minimum intensity to turn-ON the device significantly depends on the wavelength. This intensity becomes less than 0.003 times when the wavelength changed from 380 to 325 nm. In addition, the breakover voltage is affected by the constant incident light even if the intensity is tiny.
Fichier principal
Vignette du fichier
Fullpaper_ver11Cleanuped.pdf (713.09 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01636430 , version 1 (20-05-2019)

Identifiants

Citer

Junichi Hasegawa, Loris Pace, Luong Viet Phung, Mutsuko Hatano, Dominique Planson. Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation. IEEE Transactions on Electron Devices, 2017, 64 (3), pp.1203-1208. ⟨10.1109/TED.2017.2657223⟩. ⟨hal-01636430⟩
163 Consultations
217 Téléchargements

Altmetric

Partager

More