Present and future of I/O-buffer behavioral macromodels - Archive ouverte HAL
Article Dans Une Revue IEEE Electromagnetic Compatibility Magazine Année : 2016

Present and future of I/O-buffer behavioral macromodels

Résumé

Modern Signal and Power Integrity (SI/PI) verification flows rely on accurate models for complex I/O-buffers that drive and receive electrical signals on high-speed channels. The sheer density of modern integrated circuits makes detailed transistor-level descriptions computationally cumbersome to the point where they become unusable for system-level simulations. Fortunately, transistor-level descriptions may be replaced with more compact representations that approximate the input/output buffers behavior with considerable accuracy while providing a simulation speedup of several orders of magnitude. Known as behavioral models, surrogate models or macromodels, these computationally efficient equivalents have become a de-facto industry standard in SI/PI simulations. This paper presents an overview of the state-of-the-art in I/O-buffer behavioral modeling, introducing the main features of both standard and emerging solutions. Open issues and future research directions are also discussed.

Domaines

Electronique
Fichier principal
Vignette du fichier
jnl-2016-emcmagazine-mpilog_publication.pdf (1.35 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01521778 , version 1 (12-05-2017)

Identifiants

Citer

Gianni Signorini, Claudio Siviero, Mihai Telescu, Igor Simone Stievano. Present and future of I/O-buffer behavioral macromodels. IEEE Electromagnetic Compatibility Magazine, 2016, 5 (3), pp.79-85. ⟨10.1109/MEMC.0.7764256⟩. ⟨hal-01521778⟩
155 Consultations
563 Téléchargements

Altmetric

Partager

More