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Article Dans Une Revue IEEE Electromagnetic Compatibility Magazine Année : 2016

Present and future of I/O-buffer behavioral macromodels

Résumé

Modern Signal and Power Integrity (SI/PI) verification flows rely on accurate models for complex I/O-buffers that drive and receive electrical signals on high-speed channels. The sheer density of modern integrated circuits makes detailed transistor-level descriptions computationally cumbersome to the point where they become unusable for system-level simulations. Fortunately, transistor-level descriptions may be replaced with more compact representations that approximate the input/output buffers behavior with considerable accuracy while providing a simulation speedup of several orders of magnitude. Known as behavioral models, surrogate models or macromodels, these computationally efficient equivalents have become a de-facto industry standard in SI/PI simulations. This paper presents an overview of the state-of-the-art in I/O-buffer behavioral modeling, introducing the main features of both standard and emerging solutions. Open issues and future research directions are also discussed.

Domaines

Electronique
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Dates et versions

hal-01521778 , version 1 (12-05-2017)

Identifiants

Citer

Gianni Signorini, Claudio Siviero, Mihai Telescu, Igor Simone Stievano. Present and future of I/O-buffer behavioral macromodels. IEEE Electromagnetic Compatibility Magazine, 2016, 5 (3), pp.79-85. ⟨10.1109/MEMC.0.7764256⟩. ⟨hal-01521778⟩
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