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Communication Dans Un Congrès Année : 2015

Scanning thermal microscopy and Raman thermometry for the measurement of effective thermal conductivities in porous silicon−related materials

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hal-01464969 , version 1 (10-02-2017)

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  • HAL Id : hal-01464969 , version 1

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M. Massoud, P.−o. Chapuis, B. Canut, S. Gomès, J.M. Bluet. Scanning thermal microscopy and Raman thermometry for the measurement of effective thermal conductivities in porous silicon−related materials. MRS Spring Meeting − symposium M “Nanoscale Heat Transport—From Fundamentals to Devices, Apr 2015, San Francisco, United States. ⟨hal-01464969⟩
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