Predicting the risk of non-compliance to EMC requirements during the life-cycle - Archive ouverte HAL Access content directly
Conference Papers Year : 2016

Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer
He Huang
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  • PersonId : 957544
Sonia Ben Dhia

Abstract

This paper presents a simulation flow for the prediction of the long-term evolution of EMC levels during the lifetime of electronic devices or systems. This new requirement is essential to extend the warranty of critical applications operating in harsh environments. The simulation of the evolution of the electromagnetic emission of a switched-mode power supply is given as a validation case.

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Electronics
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Dates and versions

hal-01403875 , version 1 (28-11-2016)

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Cite

Alexandre Boyer, He Huang, Sonia Ben Dhia. Predicting the risk of non-compliance to EMC requirements during the life-cycle. 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, ⟨10.1109/APEMC.2016.7522766⟩. ⟨hal-01403875⟩
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